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Enhanced electrical conductivity at Fe3O4 grain boundaries.

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Title: Enhanced electrical conductivity at Fe3O4 grain boundaries.
Authors: Yao T; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.; School of Materials Science and Engineering, University of Science and Technology of China, Shenyang 110016, China., Gao C; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.; Jiangxi Copper Technology Research Institute Co. Ltd., Nanchang 330096, China., Sun Z; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.; School of Materials Science and Engineering, University of Science and Technology of China, Shenyang 110016, China., Tao A; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China., Jiang Y; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.; School of Materials Science and Engineering, University of Science and Technology of China, Shenyang 110016, China., Yang Z; Ji Hua Laboratory, Foshan 528200, China., Ma XL; Bay Area Center for Electron Microscopy, Songshan Lake Materials Laboratory, Dongguan 523808, China.; Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China., Ye H; Ji Hua Laboratory, Foshan 528200, China., Chen C; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.; School of Materials Science and Engineering, University of Science and Technology of China, Shenyang 110016, China.
Source: Science advances [Sci Adv] 2026 May; Vol. 12 (18), pp. eaeb8164. Date of Electronic Publication: 2026 May 01.
Publication Type: Journal Article
Journal Info: Publisher: American Association for the Advancement of Science Country of Publication: United States NLM ID: 101653440 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2375-2548 (Electronic) Linking ISSN: 23752548 NLM ISO Abbreviation: Sci Adv Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Enhanced electrical conductivity at Fe<subscript>3</subscript>O<subscript>4</subscript> grain boundaries.
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  Data: <searchLink fieldCode="AU" term="%22Yao+T%22">Yao T</searchLink>; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.; School of Materials Science and Engineering, University of Science and Technology of China, Shenyang 110016, China.<br /><searchLink fieldCode="AU" term="%22Gao+C%22">Gao C</searchLink>; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.; Jiangxi Copper Technology Research Institute Co. Ltd., Nanchang 330096, China.<br /><searchLink fieldCode="AU" term="%22Sun+Z%22">Sun Z</searchLink>; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.; School of Materials Science and Engineering, University of Science and Technology of China, Shenyang 110016, China.<br /><searchLink fieldCode="AU" term="%22Tao+A%22">Tao A</searchLink>; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.<br /><searchLink fieldCode="AU" term="%22Jiang+Y%22">Jiang Y</searchLink>; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.; School of Materials Science and Engineering, University of Science and Technology of China, Shenyang 110016, China.<br /><searchLink fieldCode="AU" term="%22Yang+Z%22">Yang Z</searchLink>; Ji Hua Laboratory, Foshan 528200, China.<br /><searchLink fieldCode="AU" term="%22Ma+XL%22">Ma XL</searchLink>; Bay Area Center for Electron Microscopy, Songshan Lake Materials Laboratory, Dongguan 523808, China.; Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China.<br /><searchLink fieldCode="AU" term="%22Ye+H%22">Ye H</searchLink>; Ji Hua Laboratory, Foshan 528200, China.<br /><searchLink fieldCode="AU" term="%22Chen+C%22">Chen C</searchLink>; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.; School of Materials Science and Engineering, University of Science and Technology of China, Shenyang 110016, China.
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  Data: <searchLink fieldCode="JN" term="%22101653440%22">Science advances</searchLink> [Sci Adv] 2026 May; Vol. 12 (18), pp. eaeb8164. <i>Date of Electronic Publication: </i>2026 May 01.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22American+Association+for+the+Advancement+of+Science%22">American Association for the Advancement of Science </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>101653440 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>2375-2548 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2223752548%22">23752548 </searchLink><i>NLM ISO Abbreviation: </i>Sci Adv <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=42066071
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        Value: 10.1126/sciadv.aeb8164
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        Text: English
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      – TitleFull: Enhanced electrical conductivity at Fe3O4 grain boundaries.
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              Text: 2026 May
              Type: published
              Y: 2026
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