Fabrication of focused electron beam induced deposition tips for high-speed atomic force microscopy using benchtop scanning electron microscopy.
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| Title: | Fabrication of focused electron beam induced deposition tips for high-speed atomic force microscopy using benchtop scanning electron microscopy. |
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| Authors: | Imamura M; Department of Anesthesiology, Weill Cornell Medicine, New York, NY, USA., Miyagi A; Department of Anesthesiology, Weill Cornell Medicine, New York, NY, USA., Perrino AP; Department of Anesthesiology, Weill Cornell Medicine, New York, NY, USA.; Advanced Science Research Center (ASRC), The Graduate Center of the City University of New York, New York, NY, USA., Scheuring S; Department of Anesthesiology, Weill Cornell Medicine, New York, NY, USA. sis2019@med.cornell.edu.; Department of Biochemistry and Biophysics, Weill Cornell Medicine, New York, NY, USA. sis2019@med.cornell.edu. |
| Source: | Nature protocols [Nat Protoc] 2026 May 12. Date of Electronic Publication: 2026 May 12. |
| Publication Type: | Journal Article; Review |
| Journal Info: | Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101284307 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1750-2799 (Electronic) Linking ISSN: 17502799 NLM ISO Abbreviation: Nat Protoc Subsets: MEDLINE |
| Database: | MEDLINE Ultimate |
| ISSN: | 1750-2799 |
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| DOI: | 10.1038/s41596-026-01369-3 |
