APA (7th ed.) Citation

M, I., A, M., AP, P., & S, S. (2026). Fabrication of focused electron beam induced deposition tips for high-speed atomic force microscopy using benchtop scanning electron microscopy. Nature protocols. https://doi.org/10.1038/s41596-026-01369-3

Chicago Style (17th ed.) Citation

M, Imamura, Miyagi A, Perrino AP, and Scheuring S. "Fabrication of Focused Electron Beam Induced Deposition Tips for High-speed Atomic Force Microscopy Using Benchtop Scanning Electron Microscopy." Nature Protocols 2026. https://doi.org/10.1038/s41596-026-01369-3.

MLA (9th ed.) Citation

M, Imamura, et al. "Fabrication of Focused Electron Beam Induced Deposition Tips for High-speed Atomic Force Microscopy Using Benchtop Scanning Electron Microscopy." Nature Protocols, 2026, https://doi.org/10.1038/s41596-026-01369-3.