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Fabrication of focused electron beam induced deposition tips for high-speed atomic force microscopy using benchtop scanning electron microscopy.

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Title: Fabrication of focused electron beam induced deposition tips for high-speed atomic force microscopy using benchtop scanning electron microscopy.
Authors: Imamura M; Department of Anesthesiology, Weill Cornell Medicine, New York, NY, USA., Miyagi A; Department of Anesthesiology, Weill Cornell Medicine, New York, NY, USA., Perrino AP; Department of Anesthesiology, Weill Cornell Medicine, New York, NY, USA.; Advanced Science Research Center (ASRC), The Graduate Center of the City University of New York, New York, NY, USA., Scheuring S; Department of Anesthesiology, Weill Cornell Medicine, New York, NY, USA. sis2019@med.cornell.edu.; Department of Biochemistry and Biophysics, Weill Cornell Medicine, New York, NY, USA. sis2019@med.cornell.edu.
Source: Nature protocols [Nat Protoc] 2026 May 12. Date of Electronic Publication: 2026 May 12.
Publication Type: Journal Article; Review
Journal Info: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101284307 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1750-2799 (Electronic) Linking ISSN: 17502799 NLM ISO Abbreviation: Nat Protoc Subsets: MEDLINE
Database: MEDLINE Ultimate
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  Data: <searchLink fieldCode="AU" term="%22Imamura+M%22">Imamura M</searchLink>; Department of Anesthesiology, Weill Cornell Medicine, New York, NY, USA.<br /><searchLink fieldCode="AU" term="%22Miyagi+A%22">Miyagi A</searchLink>; Department of Anesthesiology, Weill Cornell Medicine, New York, NY, USA.<br /><searchLink fieldCode="AU" term="%22Perrino+AP%22">Perrino AP</searchLink>; Department of Anesthesiology, Weill Cornell Medicine, New York, NY, USA.; Advanced Science Research Center (ASRC), The Graduate Center of the City University of New York, New York, NY, USA.<br /><searchLink fieldCode="AU" term="%22Scheuring+S%22">Scheuring S</searchLink>; Department of Anesthesiology, Weill Cornell Medicine, New York, NY, USA. sis2019@med.cornell.edu.; Department of Biochemistry and Biophysics, Weill Cornell Medicine, New York, NY, USA. sis2019@med.cornell.edu.
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        Value: 10.1038/s41596-026-01369-3
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      – TitleFull: Fabrication of focused electron beam induced deposition tips for high-speed atomic force microscopy using benchtop scanning electron microscopy.
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              Text: 2026 May 12
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