| Authors: |
Wang Y; Department of Chemistry, Columbia University, New York, NY, USA.; Department of Mechanical Engineering, Columbia University, New York, NY, USA., Choe J; Department of Chemistry, Columbia University, New York, NY, USA., Anderson E; Department of Physics, University of Washington, Seattle, WA, USA., Li W; Department of Physics, University of Washington, Seattle, WA, USA., Ingham J; Department of Physics, Columbia University, New York, NY, USA., Arsenault EA; Department of Chemistry, Columbia University, New York, NY, USA., Li Y; Department of Chemistry, Columbia University, New York, NY, USA., Hu X; Department of Materials Science and Engineering, University of Washington, Seattle, WA, USA., Taniguchi T; Research Center for Materials Nanoarchitectonics, National Institute for Materials Science, Tsukuba, Japan., Watanabe K; Research Center for Electronic and Optical Materials, National Institute for Materials Science, Tsukuba, Japan., Roy X; Department of Chemistry, Columbia University, New York, NY, USA., Basov D; Department of Physics, Columbia University, New York, NY, USA., Xiao D; Department of Materials Science and Engineering, University of Washington, Seattle, WA, USA., Queiroz R; Department of Physics, Columbia University, New York, NY, USA., Hone JC; Department of Mechanical Engineering, Columbia University, New York, NY, USA., Xu X; Department of Physics, University of Washington, Seattle, WA, USA.; Department of Materials Science and Engineering, University of Washington, Seattle, WA, USA., Zhu XY; Department of Chemistry, Columbia University, New York, NY, USA. xyzhu@columbia.edu. |
