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High‑density mapping of stripe rust resistance gene YrH8 in wheat line Hangmai 8.

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Bibliographic Details
Title: High‑density mapping of stripe rust resistance gene YrH8 in wheat line Hangmai 8.
Authors: Wu C; State Key Laboratory for Crop Stress Resistance and High-Efficiency Production, College of Plant Protection, Northwest A&F University, Yangling, 712100, Shaanxi, China., Liu M; State Key Laboratory for Crop Stress Resistance and High-Efficiency Production, College of Plant Protection, Northwest A&F University, Yangling, 712100, Shaanxi, China., Cheng P; State Key Laboratory for Crop Stress Resistance and High-Efficiency Production, College of Plant Protection, Northwest A&F University, Yangling, 712100, Shaanxi, China., Wang B; State Key Laboratory for Crop Stress Resistance and High-Efficiency Production, College of Plant Protection, Northwest A&F University, Yangling, 712100, Shaanxi, China. wangbt@nwsuaf.edu.cn., Li Q; State Key Laboratory for Crop Stress Resistance and High-Efficiency Production, College of Plant Protection, Northwest A&F University, Yangling, 712100, Shaanxi, China. qiangli@nwsuaf.edu.cn.
Source: TAG. Theoretical and applied genetics. Theoretische und angewandte Genetik [Theor Appl Genet] 2026 Jun 09; Vol. 139 (7). Date of Electronic Publication: 2026 Jun 09.
Publication Type: Journal Article
Journal Info: Publisher: Springer Country of Publication: Germany NLM ID: 0145600 Publication Model: Electronic Cited Medium: Internet ISSN: 1432-2242 (Electronic) Linking ISSN: 00405752 NLM ISO Abbreviation: Theor Appl Genet Subsets: MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1432-2242
DOI:10.1007/s00122-026-05275-w