| Authors: |
Patel RK; Department of Electrical and Computer Engineering, Rutgers University, Piscataway, New Jersey, USA., Zama K; Department of Electrical and Computer Engineering, Rutgers University, Piscataway, New Jersey, USA., Smart M; Lewis-Sigler Institute of Integrative Genomics, Princeton University, Princeton, New Jersey, USA., Eathirajan R; Department of Physics, Florida State University, Tallahassee, Florida, USA.; National High Magnetic Field Laboratory, Tallahassee, Florida, USA., Seskar I; WINLAB, Rutgers University, North Brunswick, New Jersey, USA., Mandayam N; WINLAB, Rutgers University, North Brunswick, New Jersey, USA., Ni G; Department of Physics, Florida State University, Tallahassee, Florida, USA.; National High Magnetic Field Laboratory, Tallahassee, Florida, USA., Mönnigmann M; Department of Mechanical Engineering, Ruhr University Bochum, Bochum, Germany., Ramanathan S; Department of Electrical and Computer Engineering, Rutgers University, Piscataway, New Jersey, USA. |
