| Authors: |
Zhu JC; School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou, Henan 450001, China., Zhu MJ; School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou, Henan 450001, China., Wu P; School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou, Henan 450001, China., He QZ; School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou, Henan 450001, China., Wang JT; School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou, Henan 450001, China.; Henan Key Laboratory of Brain Science and Brain Computer Interface Technology, Zhengzhou, Henan 450001, China., Niu XK; School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou, Henan 450001, China.; Henan Key Laboratory of Brain Science and Brain Computer Interface Technology, Zhengzhou, Henan 450001, China., Wang ZZ; School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou, Henan 450001, China.; Henan Key Laboratory of Brain Science and Brain Computer Interface Technology, Zhengzhou, Henan 450001, China. E-mail: wzz1982@zzu.edu.cn. |
