| Authors: |
Wu R; School of Information Science and Engineering, Shenyang University of Technology, No. 111, Shenliao West Road, Economic & Technological Development Zone, Shenyang 110870, China., Wang Q; School of Information Science and Engineering, Shenyang University of Technology, No. 111, Shenliao West Road, Economic & Technological Development Zone, Shenyang 110870, China., Gai Y; School of Information Science and Engineering, Shenyang University of Technology, No. 111, Shenliao West Road, Economic & Technological Development Zone, Shenyang 110870, China., Zhang X; School of Information Science and Engineering, Shenyang University of Technology, No. 111, Shenliao West Road, Economic & Technological Development Zone, Shenyang 110870, China., Shan X; School of Information Science and Engineering, Shenyang University of Technology, No. 111, Shenliao West Road, Economic & Technological Development Zone, Shenyang 110870, China., Jia D; School of Information Science and Engineering, Shenyang University of Technology, No. 111, Shenliao West Road, Economic & Technological Development Zone, Shenyang 110870, China. |
