Transportation mechanisms of bubble-enhanced PFOS degradation by plasma.

Saved in:
Bibliographic Details
Title: Transportation mechanisms of bubble-enhanced PFOS degradation by plasma.
Authors: Qing S; Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo 152-8552, Japan. Electronic address: shanshan@hv.ee.e.titech.ac.jp., Shen K; Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo 152-8552, Japan., Wang D; Institute of Industrial Nanomaterials, Kumamoto University, Kumamoto 860-8555, Japan., Namihira T; Institute of Industrial Nanomaterials, Kumamoto University, Kumamoto 860-8555, Japan., Kawasaki T; Department of Electrical Engineering, Nishinippon Institute of Technology, Fukuoka 800-0394, Japan., Takeuchi N; Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo 152-8552, Japan.
Source: Journal of hazardous materials [J Hazard Mater] 2026 Jun 26; Vol. 514, pp. 142817. Date of Electronic Publication: 2026 Jun 26.
Publication Type: Journal Article
Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 9422688 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1873-3336 (Electronic) Linking ISSN: 03043894 NLM ISO Abbreviation: J Hazard Mater Subsets: MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1873-3336
DOI:10.1016/j.jhazmat.2026.142817