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Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials.

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Bibliographic Details
Title: Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials.
Authors: Miller, Matthew J.1 (AUTHOR), Cabral, Matthew J.2 (AUTHOR), Dickey, Elizabeth C.3 (AUTHOR), LeBeau, James M.4 (AUTHOR), Reich, Brian J.1 (AUTHOR)
Source: Technometrics. Feb 2022, Vol. 64 Issue 1, p103-113. 11p.
Database: Mathematics Source
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Description
ISSN:00401706
DOI:10.1080/00401706.2021.1905070