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Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials.

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Title: Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials.
Authors: Miller, Matthew J.1 (AUTHOR), Cabral, Matthew J.2 (AUTHOR), Dickey, Elizabeth C.3 (AUTHOR), LeBeau, James M.4 (AUTHOR), Reich, Brian J.1 (AUTHOR)
Source: Technometrics. Feb 2022, Vol. 64 Issue 1, p103-113. 11p.
Database: Mathematics Source
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PubType: Academic Journal
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  Data: <searchLink fieldCode="JN" term="%22Technometrics%22">Technometrics</searchLink>. Feb 2022, Vol. 64 Issue 1, p103-113. 11p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=msf&AN=155003298
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        Value: 10.1080/00401706.2021.1905070
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        Text: English
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              Text: Feb 2022
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              Y: 2022
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