Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials.
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| Title: | Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials. |
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| Authors: | Miller, Matthew J.1 (AUTHOR), Cabral, Matthew J.2 (AUTHOR), Dickey, Elizabeth C.3 (AUTHOR), LeBeau, James M.4 (AUTHOR), Reich, Brian J.1 (AUTHOR) |
| Source: | Technometrics. Feb 2022, Vol. 64 Issue 1, p103-113. 11p. |
| Database: | Mathematics Source |
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