There and back again: bulk-to-defect via Ward identities.

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Bibliographic Details
Title:	There and back again: bulk-to-defect via Ward identities.
Authors:	Belton, Jake¹ (AUTHOR) jake.belton@kcl.ac.uk, Kong, Ziwen² (AUTHOR) zwn.kong@gmail.com
Source:	Journal of High Energy Physics. May2026, Vol. 2026 Issue 5, p1-34. 34p.
Database:	Mathematics Source

Description
ISSN:	11266708
DOI:	10.1007/JHEP05(2026)103