ISTFA 2012 : Conference Proceedings From the 38th International Symposium for Testing and Failure Analysis: November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA

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Bibliographic Details
Title: ISTFA 2012 : Conference Proceedings From the 38th International Symposium for Testing and Failure Analysis: November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA
Description: This title features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Authors: EDFAS Organizing Committee
Resource Type: eBook.
Subjects: Electronics--Materials--Testing--Congresses, Electronic apparatus and appliances--Testing--Congresses
Categories: TECHNOLOGY & ENGINEERING / Mechanical
Database: eBook Collection (EBSCOhost)
Description
Abstract:This title features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
ISBN:9781615039791
9781615039951