Measurement Technology and Its Application III

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Bibliographic Details
Title:	Measurement Technology and Its Application III
Description:	Selected, peer reviewed papers from the 2014 International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China
Authors:	Prasad Yarlagadda, Yun Hae Kim
Resource Type:	eBook.
Subjects:	Detectors--Congresses, Measurement--Congresses, Measuring instruments--Congresses
Categories:	TECHNOLOGY & ENGINEERING / General
Database:	eBook Collection (EBSCOhost)

Description
Abstract:	Selected, peer reviewed papers from the 2014 International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China
ISBN:	9783038351382 9783038265214