Scanning electron microscopy : physics of image formation and microanalysis /

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Bibliographic Details
Main Author:	Reimer, Ludwig
Format:	Book
Language:	English
Published:	New York : Springer, 1998.
Edition:	2nd edition
Subjects:	Microscopía electrónica Microanálisis Electrones Difracción Óptica Electrónica
Notas Contenido:	Introduction Electron optics of a scanning electron microscope Electron scattering and diffusion Emission of backscattered and secondary electrons Electron detectors and spectrometers Image contrast and signal processing electron-Beam-induced current and cathodoluminescence Special techniques in SEM Crystal structure analysis by diffraction Elemental analysis and imaging with X-rays

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Call Number:	502.825 R363s
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