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|a Reimer, Ludwig
|
| 245 |
1 |
0 |
|a Scanning electron microscopy :
|b physics of image formation and microanalysis /
|c Ludwig Reimer.
|
| 250 |
|
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|a 2nd edition
|
| 260 |
|
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|a New York :
|b Springer,
|c 1998.
|
| 300 |
|
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|a 527 páginas :
|b ilustraciones; fotografías ;
|c 24 cm.
|
| 504 |
|
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|a Bibliografía: 449-514 páginas
|
| 505 |
2 |
|
|a Introduction -- Electron optics of a scanning electron microscope -- Electron scattering and diffusion -- Emission of backscattered and secondary electrons -- Electron detectors and spectrometers -- Image contrast and signal processing -- electron-Beam-induced current and cathodoluminescence -- Special techniques in SEM -- Crystal structure analysis by diffraction -- Elemental analysis and imaging with X-rays
|
| 650 |
1 |
7 |
|a Microscopía electrónica
|2 Armarc
|
| 650 |
2 |
7 |
|a Microanálisis
|2 Armarc
|
| 650 |
2 |
7 |
|a Electrones
|2 Armarc
|
| 650 |
2 |
7 |
|a Difracción
|2 Armarc
|
| 650 |
2 |
7 |
|a Óptica Electrónica
|2 Armarc
|
| 952 |
|
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|o 502.825 R363s
|p 769230002591
|r 2026-01-07 16:29:44
|t Ej. 1
|w 2026-01-07
|y BOOK
|z Calle 52 No. 2 Bis-15, Cali
|
| 999 |
|
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|c 64854
|d 64854
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| 942 |
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|6 502_825000000000000__R363S
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