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Scanning electron microscopy : physics of image formation and microanalysis /

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Bibliographic Details
Main Author: Reimer, Ludwig
Format: Book
Language: English
Published: New York : Springer, 1998.
Edition: 2nd edition
Subjects:
Microscopía electrónica
Microanálisis
Electrones
Difracción
Óptica Electrónica
Notas Contenido:
  • Introduction
  • Electron optics of a scanning electron microscope
  • Electron scattering and diffusion
  • Emission of backscattered and secondary electrons
  • Electron detectors and spectrometers
  • Image contrast and signal processing
  • electron-Beam-induced current and cathodoluminescence
  • Special techniques in SEM
  • Crystal structure analysis by diffraction
  • Elemental analysis and imaging with X-rays

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