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|a Echlin, Patrick
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| 245 |
1 |
0 |
|a Handbook of sample preparation for scanning electron microscopy and X-ray microanalysis /
|c Patrick Echlin.
|
| 260 |
|
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|a Cambridge :
|b Springer,
|c 2009.
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| 300 |
|
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|a 330 páginas :
|b ilustraciones ;
|c 24 cm.
|
| 504 |
|
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|a Incluye bibliografía e índice
|
| 505 |
2 |
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|a Introduction --Sample collection and selection -- Sample preparation tools -- sample support -- Sample Embedding and mounting -- Sample exposure -- Sample dehydration -- Sample stabilization for imaging in the SEM -- Sample Stabilization to preserve chemical identity -- Sample cleaning -- Sample surface charge elimination -- Sample artifacts and damage -- Additional sources in information
|
| 650 |
1 |
7 |
|a Microscopía electrónica
|2 Armarc
|
| 650 |
2 |
7 |
|a Microanálisis
|2 Armarc
|
| 952 |
|
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|d 2014-05-05
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|o 502.825 E18h
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|r 2026-01-07 16:40:58
|t Ej. 1
|w 2026-01-07
|y BOOK
|z Calle 52 No. 2 Bis-15, Cali
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|c 70709
|d 70709
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| 942 |
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|6 502_825000000000000__E18H
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