Handbook of sample preparation for scanning electron microscopy and X-ray microanalysis /
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Bibliographic Details
| Main Author: |
Echlin, Patrick |
| Format: |
Book
|
| Language: |
English |
| Published: |
Cambridge :
Springer,
2009.
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| Subjects: |
|
| Notas Contenido: |
- Introduction
- Sample collection and selection
- Sample preparation tools
- sample support
- Sample Embedding and mounting
- Sample exposure
- Sample dehydration
- Sample stabilization for imaging in the SEM
- Sample Stabilization to preserve chemical identity
- Sample cleaning
- Sample surface charge elimination
- Sample artifacts and damage
- Additional sources in information
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