Cover Image

Handbook of sample preparation for scanning electron microscopy and X-ray microanalysis /

Saved in:
Bibliographic Details
Main Author: Echlin, Patrick
Format: Book
Language: English
Published: Cambridge : Springer, 2009.
Subjects:
Microscopía electrónica
Microanálisis
Notas Contenido:
  • Introduction
  • Sample collection and selection
  • Sample preparation tools
  • sample support
  • Sample Embedding and mounting
  • Sample exposure
  • Sample dehydration
  • Sample stabilization for imaging in the SEM
  • Sample Stabilization to preserve chemical identity
  • Sample cleaning
  • Sample surface charge elimination
  • Sample artifacts and damage
  • Additional sources in information

Similar Items

Similar Items