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Light reflectance and photoelectron yield spectroscopy enable acceptor level measurement in p-type Ba1−xTiO3 semiconductor.

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Title: Light reflectance and photoelectron yield spectroscopy enable acceptor level measurement in p-type Ba1−xTiO3 semiconductor.
Authors: Fujii, Saya1, Kano, Jun1, kano-j@cc.okayama-u.ac.jp, Oshime, Norihiro2, Higuchi, Tohru3, Nishina, Yuta1,4, Fujii, Tatsuo1, Ikeda, Naoshi1, Ota, Hiromi5
Source: Journal of Applied Physics; 2/28/2021, Vol. 129 Issue 8, p1-7, 7p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 148947505
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Light reflectance and photoelectron yield spectroscopy enable acceptor level measurement in p-type Ba1−xTiO3 semiconductor.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; 2/28/2021, Vol. 129 Issue 8, p1-7, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=148947505
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1063/5.0033761
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 7
        StartPage: 1
    Titles:
      – TitleFull: Light reflectance and photoelectron yield spectroscopy enable acceptor level measurement in p-type Ba1−xTiO3 semiconductor.
        Type: main
  BibRelationships:
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      – PersonEntity:
          Name:
            NameFull: Fujii, Saya
      – PersonEntity:
          Name:
            NameFull: Kano, Jun
      – PersonEntity:
          Name:
            NameFull: Oshime, Norihiro
      – PersonEntity:
          Name:
            NameFull: Higuchi, Tohru
      – PersonEntity:
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            NameFull: Nishina, Yuta
      – PersonEntity:
          Name:
            NameFull: Fujii, Tatsuo
      – PersonEntity:
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            NameFull: Ikeda, Naoshi
      – PersonEntity:
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            NameFull: Ota, Hiromi
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          Dates:
            – D: 28
              M: 02
              Text: 2/28/2021
              Type: published
              Y: 2021
          Identifiers:
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              Value: 00218979
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              Value: 129
            – Type: issue
              Value: 8
          Titles:
            – TitleFull: Journal of Applied Physics
              Type: main
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