Atomic layer etching technique for InAlN/GaN heterostructure with AlN etch-stop layer.
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| Title: | Atomic layer etching technique for InAlN/GaN heterostructure with AlN etch-stop layer. |
|---|---|
| Authors: | Du, Fangzhou1, Jiang, Yang1, Qiao, Zepeng1, Wu, Zhanxia2, Tang, Chuying1, He, Jiaqi1, Zhou, Guangnan1, Cheng, Wei-Chih1, Tang, Xinyi1, Wang, Qing1,3,4, wangq7@sustech.edu.cn, Yu, Hongyu1,3,4, yuhy@sustech.edu.cn |
| Source: | Materials Science in Semiconductor Processing; Jun2022, Vol. 143, pN.PAG-N.PAG, 1p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 155662110 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Atomic layer etching technique for InAlN/GaN heterostructure with AlN etch-stop layer. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Du%2C+Fangzhou%22">Du, Fangzhou</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Jiang%2C+Yang%22">Jiang, Yang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Qiao%2C+Zepeng%22">Qiao, Zepeng</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wu%2C+Zhanxia%22">Wu, Zhanxia</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Tang%2C+Chuying%22">Tang, Chuying</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22He%2C+Jiaqi%22">He, Jiaqi</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhou%2C+Guangnan%22">Zhou, Guangnan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Cheng%2C+Wei-Chih%22">Cheng, Wei-Chih</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Tang%2C+Xinyi%22">Tang, Xinyi</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wang%2C+Qing%22">Wang, Qing</searchLink><relatesTo>1,3,4</relatesTo>, <i>wangq7@sustech.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Yu%2C+Hongyu%22">Yu, Hongyu</searchLink><relatesTo>1,3,4</relatesTo>, <i>yuhy@sustech.edu.cn</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Materials+Science+in+Semiconductor+Processing%22">Materials Science in Semiconductor Processing</searchLink>; Jun2022, Vol. 143, pN.PAG-N.PAG, 1p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=155662110 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1016/j.mssp.2022.106544 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 1 StartPage: N.PAG Titles: – TitleFull: Atomic layer etching technique for InAlN/GaN heterostructure with AlN etch-stop layer. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Du, Fangzhou – PersonEntity: Name: NameFull: Jiang, Yang – PersonEntity: Name: NameFull: Qiao, Zepeng – PersonEntity: Name: NameFull: Wu, Zhanxia – PersonEntity: Name: NameFull: Tang, Chuying – PersonEntity: Name: NameFull: He, Jiaqi – PersonEntity: Name: NameFull: Zhou, Guangnan – PersonEntity: Name: NameFull: Cheng, Wei-Chih – PersonEntity: Name: NameFull: Tang, Xinyi – PersonEntity: Name: NameFull: Wang, Qing – PersonEntity: Name: NameFull: Yu, Hongyu IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 06 Text: Jun2022 Type: published Y: 2022 Identifiers: – Type: issn-print Value: 13698001 Numbering: – Type: volume Value: 143 Titles: – TitleFull: Materials Science in Semiconductor Processing Type: main |
| ResultId | 1 |