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Uncertainty-aware particle segmentation for electron microscopy at varied length scales.

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Title: Uncertainty-aware particle segmentation for electron microscopy at varied length scales.
Authors: Rettenberger, Luca1, Szymanski, Nathan J.2, Zeng, Yan3, Schuetzke, Jan1, Wang, Shilong2, Ceder, Gerbrand2, Reischl, Markus1, markus.reischl@kit.edu
Source: NPJ Computational Materials; 6/12/2024, Vol. 10 Issue 1, p1-9, 9p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 177877155
AccessLevel: 2
PubType: Academic Journal
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  Data: Uncertainty-aware particle segmentation for electron microscopy at varied length scales.
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  Data: <searchLink fieldCode="AU" term="%22Rettenberger%2C+Luca%22">Rettenberger, Luca</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Szymanski%2C+Nathan+J%2E%22">Szymanski, Nathan J.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Zeng%2C+Yan%22">Zeng, Yan</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Schuetzke%2C+Jan%22">Schuetzke, Jan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wang%2C+Shilong%22">Wang, Shilong</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Ceder%2C+Gerbrand%22">Ceder, Gerbrand</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Reischl%2C+Markus%22">Reischl, Markus</searchLink><relatesTo>1</relatesTo>, <i>markus.reischl@kit.edu</i>
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=177877155
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        Value: 10.1038/s41524-024-01302-w
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        Text: English
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              Text: 6/12/2024
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              Y: 2024
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