Fault tolerance and reliability in field-programmable gate arrays.

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Bibliographic Details
Title: Fault tolerance and reliability in field-programmable gate arrays.
Authors: Stott, E., Sedcole, P., Cheung, P.
Source: IET Computers & Digital Techniques; May 2010, Vol. 4 Issue 3, p196-210, 15p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501605670
AccessLevel: 2
PubType: Academic Journal
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        Value: 10.1049/iet-cdt.2009.0011
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        Text: English
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        PageCount: 15
        StartPage: 196
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      – TitleFull: Fault tolerance and reliability in field-programmable gate arrays.
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              Text: May 2010
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