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Microanalysis on the (200) diffraction intensity to determine the Al concentrations for AlGaAs-GaAs multiple-quantum-well structures.

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Bibliographic Details
Title: Microanalysis on the (200) diffraction intensity to determine the Al concentrations for AlGaAs-GaAs multiple-quantum-well structures.
Authors: Ou, H.-J., Cowley, J. M., Chyi, J. I.
Source: Journal of Applied Physics; January 15 1990, Vol. 67, p698-704, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501720826
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Microanalysis on the (200) diffraction intensity to determine the Al concentrations for AlGaAs-GaAs multiple-quantum-well structures.
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  Data: <searchLink fieldCode="AU" term="%22Ou%2C+H%2E-J%2E%22">Ou, H.-J.</searchLink><br /><searchLink fieldCode="AU" term="%22Cowley%2C+J%2E+M%2E%22">Cowley, J. M.</searchLink><br /><searchLink fieldCode="AU" term="%22Chyi%2C+J%2E+I%2E%22">Chyi, J. I.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; January 15 1990, Vol. 67, p698-704, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501720826
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      – Type: doi
        Value: 10.1063/1.345774
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 698
    Titles:
      – TitleFull: Microanalysis on the (200) diffraction intensity to determine the Al concentrations for AlGaAs-GaAs multiple-quantum-well structures.
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            NameFull: Ou, H.-J.
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            NameFull: Cowley, J. M.
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            NameFull: Chyi, J. I.
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            – D: 15
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              Text: January 15 1990
              Type: published
              Y: 1990
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              Value: 67
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            – TitleFull: Journal of Applied Physics
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