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A generalised FK model for the 558 line defect in graphene.

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Title: A generalised FK model for the 558 line defect in graphene.
Authors: Yao, Yin1 (AUTHOR), Yang, Jingjing1 (AUTHOR), He, Yafeng2,3 (AUTHOR), Bai, Jianhui2,3 (AUTHOR) phybai@live.com
Source: Philosophical Magazine Letters. Dec2024, Vol. 104 Issue 1, p1-8. 8p.
Database: Academic Search Ultimate
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  Data: A generalised FK model for the 558 line defect in graphene.
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  Data: <searchLink fieldCode="AR" term="%22Yao%2C+Yin%22">Yao, Yin</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yang%2C+Jingjing%22">Yang, Jingjing</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22He%2C+Yafeng%22">He, Yafeng</searchLink><relatesTo>2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Bai%2C+Jianhui%22">Bai, Jianhui</searchLink><relatesTo>2,3</relatesTo> (AUTHOR)<i> phybai@live.com</i>
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  Data: <searchLink fieldCode="JN" term="%22Philosophical+Magazine+Letters%22">Philosophical Magazine Letters</searchLink>. Dec2024, Vol. 104 Issue 1, p1-8. 8p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=181257456
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1080/09500839.2023.2293005
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      – Code: eng
        Text: English
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        PageCount: 8
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      – TitleFull: A generalised FK model for the 558 line defect in graphene.
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            NameFull: Yao, Yin
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            NameFull: Yang, Jingjing
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            NameFull: He, Yafeng
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            – D: 01
              M: 12
              Text: Dec2024
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              Y: 2024
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