View in EDS

Wobble-based on-chip calibration circuit for temperature independent oscillators.

Saved in:
Bibliographic Details
Title: Wobble-based on-chip calibration circuit for temperature independent oscillators.
Authors: De Smedt, V.1, Steyaert, W.1, Dehaene, W.1, Gielen, G.1
Source: Electronics Letters (Institution of Engineering & Technology). 8/2/2012, Vol. 48 Issue 16, p1000-1001. 2p. 2 Diagrams, 1 Graph.
Subjects: Electric oscillators, Timing circuits, Calibration, Temperature, Metal oxide semiconductors
Abstract: An automatic calibration circuit for temperature- and process-independent oscillators and timing circuits is presented. The circuit monitors the dynamic gate-source voltage of a MOS transistor of which the temperature is changing. By adapting the bias current through this transistor towards the zero-temperature-coefficient point of the VGS, the gate-source voltage can be used in temperature-independent timing circuits. Because of the dynamic nature of this regulation circuit, the technique is insensitive to mismatch and process variations. The presented technique is applied to a low-noise oscillator to make it less temperature sensitive with a factor of 8. [ABSTRACT FROM AUTHOR]
Copyright of Electronics Letters (Institution of Engineering & Technology) is the property of Institution of Engineering & Technology and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 78219949
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Wobble-based on-chip calibration circuit for temperature independent oscillators.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22De+Smedt%2C+V%2E%22">De Smedt, V.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Steyaert%2C+W%2E%22">Steyaert, W.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Dehaene%2C+W%2E%22">Dehaene, W.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Gielen%2C+G%2E%22">Gielen, G.</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Electronics+Letters+%28Institution+of+Engineering+%26+Technology%29%22">Electronics Letters (Institution of Engineering & Technology)</searchLink>. 8/2/2012, Vol. 48 Issue 16, p1000-1001. 2p. 2 Diagrams, 1 Graph.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Electric+oscillators%22">Electric oscillators</searchLink><br /><searchLink fieldCode="DE" term="%22Timing+circuits%22">Timing circuits</searchLink><br /><searchLink fieldCode="DE" term="%22Calibration%22">Calibration</searchLink><br /><searchLink fieldCode="DE" term="%22Temperature%22">Temperature</searchLink><br /><searchLink fieldCode="DE" term="%22Metal+oxide+semiconductors%22">Metal oxide semiconductors</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: An automatic calibration circuit for temperature- and process-independent oscillators and timing circuits is presented. The circuit monitors the dynamic gate-source voltage of a MOS transistor of which the temperature is changing. By adapting the bias current through this transistor towards the zero-temperature-coefficient point of the VGS, the gate-source voltage can be used in temperature-independent timing circuits. Because of the dynamic nature of this regulation circuit, the technique is insensitive to mismatch and process variations. The presented technique is applied to a low-noise oscillator to make it less temperature sensitive with a factor of 8. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Electronics Letters (Institution of Engineering & Technology) is the property of Institution of Engineering & Technology and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=78219949
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1049/el.2012.1886
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 2
        StartPage: 1000
    Subjects:
      – SubjectFull: Electric oscillators
        Type: general
      – SubjectFull: Timing circuits
        Type: general
      – SubjectFull: Calibration
        Type: general
      – SubjectFull: Temperature
        Type: general
      – SubjectFull: Metal oxide semiconductors
        Type: general
    Titles:
      – TitleFull: Wobble-based on-chip calibration circuit for temperature independent oscillators.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: De Smedt, V.
      – PersonEntity:
          Name:
            NameFull: Steyaert, W.
      – PersonEntity:
          Name:
            NameFull: Dehaene, W.
      – PersonEntity:
          Name:
            NameFull: Gielen, G.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 02
              M: 08
              Text: 8/2/2012
              Type: published
              Y: 2012
          Identifiers:
            – Type: issn-print
              Value: 00135194
          Numbering:
            – Type: volume
              Value: 48
            – Type: issue
              Value: 16
          Titles:
            – TitleFull: Electronics Letters (Institution of Engineering & Technology)
              Type: main
ResultId 1